FBI warns of privacy risks associated with Internet-connected toys
July 17, 2017
Consumer notice released about connected children's toys that may put the privacy and safety of children at risk due to the disclosure of personal information
Are you keeping a close eye on Barbie and her friends? Concerns that your child's Barbie might know more about your child than you were raised by the Federal Bureau of Investigation (FBI) which has released an article on the privacy risks associated with Internet-connected children's toys.
The FBI is encouraging consumers to consider cybersecurity prior to introducing smart, interactive, internet-connected toys into their homes as smart toys and entertainment devices for children are increasingly incorporating technologies that learn and tailor their behaviors based on user interactions. According to the FBI, these toys typically contain sensors, microphones, cameras, data storage components, and other multimedia capabilities – including speech recognition and GPS options, which could put the privacy and safety of children at risk due to the large amount of personal information that may be unwittingly disclosed.
Users and administrators are being encouraged to review the FBI article for more information and refer to the US-CERT Tip Protecting Your Privacy. The FBI is also encouraging consumers to research as much as they can about these Internet-connected toys before allowing their children to use them. If consumers believe their child's toy may have been compromised, the organization suggest filling a complaint with the Internet Crime Complain Center.
Programmable logic controllers (PLCs) and programmable automation controllers (PACs) are the brains of the machine in many regards. They have evolved over the years.This new State...
Special considerations and requirements make packaging equipment an interesting vertical market unto itself. This new State of Technology Report from the editors of ...
This paper examines highly sensitive piezoelectric sensors for precise vibration measurement which is critical in semiconductor production to prevent quality and yield issues....
